Test Engineer with 7 years of experience specializing in Wafer Level and Final Testing. Skilled in software debugging, root cause analysis, and implementing corrective actions to improve testing efficiency. Seeking to leverage expertise in test systems and failure analysis to contribute to a dynamic engineering team.
Leader Presenter of the TQM Plus for the Cost Savings of 211,000$
Team Accountable for the TQM Plus with a Cost Savings of 140,000$.
For the Resolution of L1970 LTx Probe Part causing low yield on process wafer with Cost Savings of 211,000$
Hardware Modification and Qualification: For the Resolution of ADBMS6830 Probe Card Hardware Modification from 1 Setup to 5 Setup.